Multi-Scale High Accuracy Engineering Tools for Single Event Effects Analysis in Modern Technologies

2018-10-05 16:07 by Giovanni Santin

Single Event Effects (SEE) have been known for many years to be a major source of anomalies in spacecraft. Problems are increasing because of the increasing amount of highly integrated electronic systems on board, and the need for these to have high performance. Packing densities and circuit complexities are also increasing.

Because of technology evolution, analysis techniques for quantifying single event rates and risks are of diminishing validity. New mechanisms in SEE generation are emerging, and "classical" analysis algorithms and software (such as CREME-96) are becoming rapidly outdated due to major simplifications made in the physics assumptions and in the treatment of the sensitive "bit" geometry. Growth in submicron- and nano-scale electronics leads to the need to develop new techniques, with the added challenge to deploy them in project and industrial radiation harness assurance (RHA) processes.

A consortium led by TRAD (France) has been awarded a contract for the TEC-EPS managed TRP activity "Multi-Scale High Accuracy Engineering Tools for Single Event Effects Analysis in Modern Technologies". TRAD will be supported by NanoXplore (FR), Airbus Defence and Space Ltd (UK), Thales Alenia Space UK Ltd (UK).

The development, which started in Oct 2019 and will last 18 months, will include a survey of in-flight SEE behaviour of electronics on-board European missions, development of new algorithms and modelling methods for Single Event Effects, and proposals for prediction/analysis methodology for SEE in modern technologies.

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